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Ridge regression technique to determine the environmental influences on tef (Eragrostis tef) grain yield
Item type: Journal Article • Journal: South African Journal of Plant and Soil • Authors: Legesse Kassa Debusho --- , Republic of South AfricaTef grain yield is dependent on a number of component characters such as plant height and panicle length. These characters and consequently yield are governed by a large number of factors including environmental factors. The objective of this paper was...