Original Articles

ON THE METRIZATION LEMMA FOR UNIFORM SPACES

Published in: Quaestiones Mathematicae
Volume 24 , issue 1 , 2001 , pages: 123–128

DOI: 10.1080/16073606.2001.9639779

Author(s): B. Windels , Belgium

Keywords: 54E15 , 54E35 , 54E15 , 54E35

Abstract

We show a numeric generalization of the well-known metrization lemma for uniform spaces, thereby answering a question left open in [2] to the affirmative. An application of the new lemma in the setting of approach theory yields the conclusion that every approach uniformity has a basis of pseudo-metrics.

« AN EXTENSION OF THE DIRECT METHOD VIA AN APPLICATION

Thin subspaces of L ¹(λ) »